Chip identification method for use with scan design systems and scan testing techniques.

摘要

A method and apparatus are provided for uniquely identifying integrated circuit chips adapted for use with scan design systems and scan testing techniques. A predetermined identification number corresponding to each LSS chip to be identified is assigned. Each predetermined identification number has a predefined format. The assigned identification number is stored in a plurality of predefined shift register latches (SRLs) (14-18) in the corresponding LSI chip to be identified. Then the LSI chip is identified by selectively reading out the stored predetermined identification number.