发明名称 Manufacturing ultra-thin dielectrically isolated wafers
摘要 A method including filling etched moats with a first dielectric layer and layer of polycrystalline material and planarizing. A second dielectric layer is formed on the first polycrystalline layer and a second layer of polycrystalline is formed on the second dielectric layer to form a handle. The starting material is then thinned to produce the dielectric isolated islands. Device forming steps are then performed. Finally, the handle is removed leaving a wafer having a thickness defined by the planarized surface of the first polycrystalline layer and the top surface of the first wafer.
申请公布号 US5081061(A) 申请公布日期 1992.01.14
申请号 US19910668694 申请日期 1991.03.07
申请人 HARRIS CORPORATION 发明人 ROUSE, GEORGE V.;REINECKE, PAUL S.
分类号 H01L21/762 主分类号 H01L21/762
代理机构 代理人
主权项
地址