发明名称 |
Manufacturing ultra-thin dielectrically isolated wafers |
摘要 |
A method including filling etched moats with a first dielectric layer and layer of polycrystalline material and planarizing. A second dielectric layer is formed on the first polycrystalline layer and a second layer of polycrystalline is formed on the second dielectric layer to form a handle. The starting material is then thinned to produce the dielectric isolated islands. Device forming steps are then performed. Finally, the handle is removed leaving a wafer having a thickness defined by the planarized surface of the first polycrystalline layer and the top surface of the first wafer.
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申请公布号 |
US5081061(A) |
申请公布日期 |
1992.01.14 |
申请号 |
US19910668694 |
申请日期 |
1991.03.07 |
申请人 |
HARRIS CORPORATION |
发明人 |
ROUSE, GEORGE V.;REINECKE, PAUL S. |
分类号 |
H01L21/762 |
主分类号 |
H01L21/762 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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