发明名称 METAL PLATE FLAW DETECTING PROBE
摘要 PROBLEM TO BE SOLVED: To provide a metal plate flaw detecting probe widening a detection area for easily detecting a flaw over a wide range on the front and back faces and in the inside of a metal plate. SOLUTION: This flaw detecting probe 10 performing scanning along the surface of the metal plate 30 as a specimen is constructed so as to include a primary coil 12 and a pair of secondary coils 13, 14. As to a thin long coil former 11 arranged parallelly to the surface of the metal plate, the primary coil 12 is wound on a face facing the metal plate surface and on a face on the opposite side in the longitudinal direction so as to be excited by exciting current at a predetermined frequency. Between the metal plate surface and the primary coil, the secondary coils 13, 14 are wound around a shaft vertical to the metal plate surface adjacently to each other so as to be extended in the longitudinal direction of the primary coil and differentially connected to each other.
申请公布号 JP2001264299(A) 申请公布日期 2001.09.26
申请号 JP20000074779 申请日期 2000.03.16
申请人 NIPPON HIHAKAI KENSA KK;AMIKKU:KK 发明人 HASHIMOTO MITSUO;HOSOE HIDETOSHI;ABE SHUNICHI
分类号 G01N27/90;(IPC1-7):G01N27/90 主分类号 G01N27/90
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