发明名称 |
METAL PLATE FLAW DETECTING PROBE |
摘要 |
PROBLEM TO BE SOLVED: To provide a metal plate flaw detecting probe widening a detection area for easily detecting a flaw over a wide range on the front and back faces and in the inside of a metal plate. SOLUTION: This flaw detecting probe 10 performing scanning along the surface of the metal plate 30 as a specimen is constructed so as to include a primary coil 12 and a pair of secondary coils 13, 14. As to a thin long coil former 11 arranged parallelly to the surface of the metal plate, the primary coil 12 is wound on a face facing the metal plate surface and on a face on the opposite side in the longitudinal direction so as to be excited by exciting current at a predetermined frequency. Between the metal plate surface and the primary coil, the secondary coils 13, 14 are wound around a shaft vertical to the metal plate surface adjacently to each other so as to be extended in the longitudinal direction of the primary coil and differentially connected to each other.
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申请公布号 |
JP2001264299(A) |
申请公布日期 |
2001.09.26 |
申请号 |
JP20000074779 |
申请日期 |
2000.03.16 |
申请人 |
NIPPON HIHAKAI KENSA KK;AMIKKU:KK |
发明人 |
HASHIMOTO MITSUO;HOSOE HIDETOSHI;ABE SHUNICHI |
分类号 |
G01N27/90;(IPC1-7):G01N27/90 |
主分类号 |
G01N27/90 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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