发明名称 DRY ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a plasma etching method by which etching can smoothly be carried out without opening abnormal shaped holes on the surface of an quartz glass substrate. SOLUTION: The substrate is etched by making carbon fluoride gas into a plasma state through discharging under a low pressure and then reacting the active seeds of the generated ions, neutral radicals or the like, with glass substrate materials. Initial etching is carried out by applying a highly biased voltage of 500 V to 900 V to the substrate through the use of a mixture gas of C3 F8 /CF4 as an etching gas, at the early etching stage.
申请公布号 JP2002284545(A) 申请公布日期 2002.10.03
申请号 JP20010090852 申请日期 2001.03.27
申请人 ULVAC JAPAN LTD 发明人 FUKAZAWA TAKAYUKI;HORIIKE YASUHIRO;HAYASHI TOSHIO
分类号 C03C15/00;(IPC1-7):C03C15/00 主分类号 C03C15/00
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