发明名称 GATE DRIVE CIRCUIT
摘要 PROBLEM TO BE SOLVED: To prevent an element from damage by effectively eliminating a phenomenon of abnormally heating of a certain element and generation of high surge voltage, in the case of driving a semiconductor element for electric power with two or more of the elements connected in parallel. SOLUTION: In the case of driving semiconductor elements IGBT1,2 for electric power connected in parallel from a gate drive circuit 15, a differential value of a current Ic1 flowing in the element IGBT1 in a side of temperature increasing is detected by a comparator 21, by driving a primary winding of a transformer 23 through an AND circuit 22 when an off-command 13 is given, voltage is induced in a secondary winding connected between gates of the elements, a gate potential of the element IGBT1 in a side of temperature increasing is raised, current unbalance of collector currents Ic1, Ic2 in both the elements is corrected. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004015910(A) 申请公布日期 2004.01.15
申请号 JP20020165529 申请日期 2002.06.06
申请人 FUJI ELECTRIC HOLDINGS CO LTD 发明人 TAKIZAWA AKITAKE
分类号 H02M1/08;H02M1/00;(IPC1-7):H02M1/08 主分类号 H02M1/08
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