| 摘要 |
<p>Methods of measuring the thickness or thicknesses and the composition or compositions of an alloy plating having one layer or two layers different in composition from each other, said alloy plating including a metal identical with a substrate metal, suitable for use in analyzing a Zn-Fe group one layer or two layer alloy-plated steel plate. Characteristic X-rays and white X-rays irradiate an object to be measured, a diffraction angle (2.theta.) of diffracted X-rays of the characteristic X-rays, which is diffracted by an intermetallic compound of the alloy plating is detected from the diffraction angle, to measure the composition of the alloy plating from the diffraction angle, an intensity or intensities of fluorescent X-rays from an object to be measured are detected, which are generated by the white X-rays, to simultaneously measure the thickness or thicknesses of the alloy plating from the intensity or intensities of the fluorescent X-rays and the composition of the alloy plating.</p> |
