| 摘要 |
The present invention relates to a heat shock testing apparatus which applies a heat shock to a testing target. According to an embodiment of the present invention, the heat shock testing apparatus includes: a dual chamber housing which is a housing occupying an XYZ space including X-axis, Y-axis, and Z-axis vertical to each other and a YZ plane used as a floor surface and includes a high-temperature chamber having an atmosphere at a first temperature and a low-temperature chamber having an atmosphere at a second temperature lower than the first temperature; a barrier wall which is a YZ plane partition separating the dual chamber housing on the X-axis into the high-temperature and low-temperature chambers and is made of a through-hole and a flange plane surrounding the through-hole; a testing box body which has a pipe used as a heat shock testing target arranged thereon; a transfer unit which makes the testing box body pass through the through-hole in the X-axis direction to arrange the testing box body on the high-temperature or low-temperature chambers; and a control unit which makes the high-temperature chamber to have the atmosphere at the first temperature, makes the second temperature chamber to have the atmosphere at the second temperature, arranges the testing box body in the high-temperature chamber for a first period, and moves the testing box body by controlling the transfer unit to arrange the testing box body in the low-temperature body for a second period. |
