发明名称 METHOD FOR FORMING SELF-ALIGNED CONTACT HOLE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A self-aligned contact hole formation method of semiconductor devices is provided to prevent an exposing of conductive lines at sidewalls of a contact hole due to a misalignment. CONSTITUTION: After forming a plurality of conductive lines(43) on a substrate(40), an insulating spacer(45) and a mask insulator(44) are sequentially formed at both sidewalls and top surface of the conductive lines(43). An interlayer dielectric(46) made of PE-TEOS(Plasma Enhanced-tetraethyl ortho silicon) is formed so as to form a slit void between the conductive lines. After exposing the slit void in a non-contact region, the PE-TEOS layer(46) remaining in the non-contact region is removed, so that the slit void formed between the conductive lines is expanded(C').
申请公布号 KR20020047947(A) 申请公布日期 2002.06.22
申请号 KR20000076597 申请日期 2000.12.14
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, HONG GIL;KIM, HUN SANG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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