发明名称 |
METHOD FOR FORMING SELF-ALIGNED CONTACT HOLE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A self-aligned contact hole formation method of semiconductor devices is provided to prevent an exposing of conductive lines at sidewalls of a contact hole due to a misalignment. CONSTITUTION: After forming a plurality of conductive lines(43) on a substrate(40), an insulating spacer(45) and a mask insulator(44) are sequentially formed at both sidewalls and top surface of the conductive lines(43). An interlayer dielectric(46) made of PE-TEOS(Plasma Enhanced-tetraethyl ortho silicon) is formed so as to form a slit void between the conductive lines. After exposing the slit void in a non-contact region, the PE-TEOS layer(46) remaining in the non-contact region is removed, so that the slit void formed between the conductive lines is expanded(C').
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申请公布号 |
KR20020047947(A) |
申请公布日期 |
2002.06.22 |
申请号 |
KR20000076597 |
申请日期 |
2000.12.14 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, HONG GIL;KIM, HUN SANG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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