Auto-blow memory repair

摘要

In an example embodiment, a method may include collecting, at a controller within an integrated circuit, defect information indicative of defects identified during a built-in self-test (BIST) operation performed on plural memories embedded within the integrated circuit. Fuses within the integrated circuit may be blown based on the defect information collected automatically and without software intervention. The fuses blown may be used to inform a built-in self-repair (BISR) operation performed on the plural memories.

主权项

1. A method comprising:
during a logic reset of an integrated circuit, collecting, at a built-in self-repair (BISR) controller within the integrated circuit, defect information indicative of defects identified during a built-in self-test (BIST) operation performed on plural memories embedded within the integrated circuit, wherein the collecting the defect information is automated in hardware on the integrated circuit and the collecting includes sending a defect request from the BISR controller to at least one memory of the plural memories; during the logic reset, blowing, by a fuse controller within the integrated circuit, one or more fuses within the integrated circuit based on the defect information collected, wherein the blowing the one or more fuses by the fuse controller is initiated and automated in hardware on the integrated circuit; during the logic reset, using, by the BISR controller, one or more fuses blown to inform a built-in self-repair (BISR) operation performed on the plural memories by BISR logic, each of the plural memories having BISR logic embedded within.