| 摘要 |
PURPOSE:To test easily the quality of each circuit in a board to be tested, in which plural circuits are placed by providing an output gate which can be controlled by a signal from the outside to each circuit of the board to be tested. CONSTITUTION:In an LSI 9, a land 25 is connected as an output gate to a gate control terminal of a three state output buffer 7a. On the other hand, in a board tester 3, a probe 27 is connected to a control terminal of a three state output buffer 15, and a gate control signal S6 is sent to a probe 27 and an output buffer 15 from a control part 13. By this control signal S6, the output of the LSI 9 in a board to be tested 1 can also be controlled together with the board tester 3, therefore, a collision of the output does not occur, and the quality of each circuit can be tested easily without requiring read of a complicated function of the LSI 9.
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