发明名称 SYSTEM FOR DETECTION AND IMAGING BY SPECTRAL ANALYSIS IN SEVERAL WAVELENGTH BANDS
摘要 The invention relates to a system for detection and infrared imaging by spectral analysis in several wavelength bands comprising: —an imaging sensor comprising a plurality of elementary sensors together forming a matrix sensitive surface; —an imaging optic adapted for forming on the sensitive surface of the imaging sensor, a first image of the scene to be analysed in a first wavelength band, and at least one second image of the scene to be analysed in a second wavelength band, characterized in that said detection and imaging system furthermore comprises an optical device consisting of a fixed optical plate adapted for shifting the first image with respect to the second image in the plane of the sensitive surface, the shift between the images being along a direction defined by a row, a column or a diagonal of elementary sensors, the shift distance being equal to the spacing of the elementary sensors of the matrix sensitive surface along this direction or to a multiple of this spacing.
申请公布号 EP2976607(B1) 申请公布日期 2016.12.21
申请号 EP20140710930 申请日期 2014.03.19
申请人 Safran Electronics & Defense 发明人 DUFRESNE DE VIREL, François;BOUSQUET, Marc
分类号 H04N5/33;F41G3/14;G01J1/04;G01J3/36;G01S3/781;G01S3/784 主分类号 H04N5/33
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