发明名称 |
SYSTEM FOR DETECTION AND IMAGING BY SPECTRAL ANALYSIS IN SEVERAL WAVELENGTH BANDS |
摘要 |
The invention relates to a system for detection and infrared imaging by spectral analysis in several wavelength bands comprising: —an imaging sensor comprising a plurality of elementary sensors together forming a matrix sensitive surface; —an imaging optic adapted for forming on the sensitive surface of the imaging sensor, a first image of the scene to be analysed in a first wavelength band, and at least one second image of the scene to be analysed in a second wavelength band, characterized in that said detection and imaging system furthermore comprises an optical device consisting of a fixed optical plate adapted for shifting the first image with respect to the second image in the plane of the sensitive surface, the shift between the images being along a direction defined by a row, a column or a diagonal of elementary sensors, the shift distance being equal to the spacing of the elementary sensors of the matrix sensitive surface along this direction or to a multiple of this spacing. |
申请公布号 |
EP2976607(B1) |
申请公布日期 |
2016.12.21 |
申请号 |
EP20140710930 |
申请日期 |
2014.03.19 |
申请人 |
Safran Electronics & Defense |
发明人 |
DUFRESNE DE VIREL, François;BOUSQUET, Marc |
分类号 |
H04N5/33;F41G3/14;G01J1/04;G01J3/36;G01S3/781;G01S3/784 |
主分类号 |
H04N5/33 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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