发明名称 Wafer manufacturing cleaning apparatus, process and method of use
摘要 A cleaning wafer or substrate for use in cleaning, or in combination with, components of, for example, integrated chip manufacturing apparatus. The cleaning substrate can include a substrate having varying predetermined surface features, such as one or more predetermined adhesive, non-tacky, electrostatic, projection, depression, or other physical sections. The predetermined features can provide for more effective cleaning of the components with which they are used, such as an integrated chip manufacturing apparatus in the place of the integrated chip wafer. The cleaning substrate can be urged into cleaning or other position by vacuum, mechanical, electrostatic, or other forces. The cleaning substrate can adapted to accomplish a variety of functions, including abrading or polishing. The cleaning substrate may be made by a novel method of making, and it may then be used in a novel method of use I combination with chip manufacturing apparatus.
申请公布号 US9595456(B2) 申请公布日期 2017.03.14
申请号 US201313971619 申请日期 2013.08.20
申请人 International Test Solutions, Inc. 发明人 Humphrey Alan E.;Duvall James H.;Broz Jerry
分类号 H01L21/67;B24B37/34;B08B1/00 主分类号 H01L21/67
代理机构 Holland & Hart LLP 代理人 Holland & Hart LLP
主权项 1. An uncompressed integrated chip manufacturing apparatus cleaning wafer of the type useable to clean an integrated chip manufacturing apparatus, the uncompressed integrated chip manufacturing apparatus cleaning wafer comprising a resilient cleaning pad having a first cleaning side and a second side, the first cleaning side including: a predetermined first tacky cleaning section on the first cleaning side having a predetermined first thickness and predetermined level of tack; and a predetermined compressible tack-free first protrusion (a) adjacent the predetermined first tacky cleaning section, and(b) having a predetermined first protrusion thickness thicker than the predetermined first thickness, said predetermined compressible tack-free first protrusion projecting farther away from the first cleaning side than the predetermined first tacky cleaning section and when compression is released providing predetermined first means for reducing contact between the predetermined first cleaning section and a portion of the semiconductor wafer manufacturing apparatus.
地址 Reno NV US