发明名称 |
Particle detection apparatus and particle detection method |
摘要 |
A particle detection apparatus and a particle detection method capable of accurately detecting scattered light are provided. A scattered light detection unit of the particle detection apparatus having at least a light illumination unit for illuminating a particle with light and the scattered light detection unit for detecting scattered light emitted from the particle illuminated with light is provided with a first detection portion for detecting scattered light, a second detection portion for detecting illumination light onto a particle, and a signal processing unit for removing a noise component from a signal detected in the first detection portion based on a signal detected in the second detection portion. |
申请公布号 |
US9638622(B2) |
申请公布日期 |
2017.05.02 |
申请号 |
US201314652433 |
申请日期 |
2013.10.15 |
申请人 |
SONY CORPORATION |
发明人 |
Tahara Katsutoshi |
分类号 |
G01N15/14;G01N21/49;G01N15/00;G01N15/10 |
主分类号 |
G01N15/14 |
代理机构 |
Chip Law Group |
代理人 |
Chip Law Group |
主权项 |
1. A particle detection apparatus, comprising:
a light illumination unit configured to illuminate a particle with light; and a scattered light detection unit configured to detect scattered light emitted from the particle illuminated with light, the scattered light detection unit including:
a first detection portion configured to detect the scattered light;a second detection portion configured to detect a light component that originates in the illumination light onto the particle; anda signal processing unit configured to remove a noise component from a signal detected in the first detection portion based on a signal detected in the second detection portion, wherein the noise component is removed based on a gain value, wherein said gain value is set based on a determination that light is emitted in an absence of the particle. |
地址 |
Tokyo JP |