发明名称 Particle detection apparatus and particle detection method
摘要 A particle detection apparatus and a particle detection method capable of accurately detecting scattered light are provided. A scattered light detection unit of the particle detection apparatus having at least a light illumination unit for illuminating a particle with light and the scattered light detection unit for detecting scattered light emitted from the particle illuminated with light is provided with a first detection portion for detecting scattered light, a second detection portion for detecting illumination light onto a particle, and a signal processing unit for removing a noise component from a signal detected in the first detection portion based on a signal detected in the second detection portion.
申请公布号 US9638622(B2) 申请公布日期 2017.05.02
申请号 US201314652433 申请日期 2013.10.15
申请人 SONY CORPORATION 发明人 Tahara Katsutoshi
分类号 G01N15/14;G01N21/49;G01N15/00;G01N15/10 主分类号 G01N15/14
代理机构 Chip Law Group 代理人 Chip Law Group
主权项 1. A particle detection apparatus, comprising: a light illumination unit configured to illuminate a particle with light; and a scattered light detection unit configured to detect scattered light emitted from the particle illuminated with light, the scattered light detection unit including: a first detection portion configured to detect the scattered light;a second detection portion configured to detect a light component that originates in the illumination light onto the particle; anda signal processing unit configured to remove a noise component from a signal detected in the first detection portion based on a signal detected in the second detection portion, wherein the noise component is removed based on a gain value, wherein said gain value is set based on a determination that light is emitted in an absence of the particle.
地址 Tokyo JP