发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
According to one embodiment, a semiconductor device includes a substrate and a gate electrode. The gate electrode includes a first electrode formed on the substrate, the first electrode having a first conductive property, with a first insulating film between the first electrode and the substrate, and a second electrode formed on the substrate, the second electrode having a second conductive property different from the first conductive property, with a second insulating film between the second electrode and the substrate. The first electrode is formed in a rectangular shape having a hollow portion. A slit is formed in a side surface of the first electrode extending in a width direction of the gate electrode. The second electrode is formed in the slit and along the side surface of the first electrode that has the slit. |
申请公布号 |
US9640629(B1) |
申请公布日期 |
2017.05.02 |
申请号 |
US201615253821 |
申请日期 |
2016.08.31 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
Miyata Toshitaka |
分类号 |
H01L21/8234;H01L29/49;H01L29/423;H01L21/28;H01L29/08;H01L29/66;H01L21/8238;H01L21/285 |
主分类号 |
H01L21/8234 |
代理机构 |
Patterson & Sheridan, LLP |
代理人 |
Patterson & Sheridan, LLP |
主权项 |
1. A semiconductor device, comprising:
a substrate; and a gate electrode, the gate electrode including a first electrode formed on the substrate, the first electrode comprising a first material having a first conductive property, with a first insulating film between the first electrode and the substrate, and a second electrode formed on the substrate, the second electrode comprising a second material having a second conductive property different from the first conductive property, with a second insulating film between the second electrode and the substrate, wherein the first electrode is formed in a rectangular shape having a hollow portion, a slit is formed in a side surface of the first electrode and extending along a width direction of the gate electrode, and the second electrode is formed in the slit and along the side surface of the first electrode that has the slit. |
地址 |
Tokyo JP |