发明名称 |
Ultraviolet Device Encapsulant |
摘要 |
A composite material, which can be used as an encapsulant for an ultraviolet device, is provided. The composite material includes a matrix material and at least one filler material incorporated in the matrix material that are both at least partially transparent to ultraviolet radiation of a target wavelength. The filler material includes microparticles and/or nanoparticles and can have a thermal coefficient of expansion significantly smaller than a thermal coefficient of expansion of the matrix material for relevant atmospheric conditions. The relevant atmospheric conditions can include a temperature and a pressure present during each of: a curing and a cool down process for fabrication of a device package including the composite material and normal operation of the ultraviolet device within the device package. |
申请公布号 |
US2017104140(A1) |
申请公布日期 |
2017.04.13 |
申请号 |
US201615389476 |
申请日期 |
2016.12.23 |
申请人 |
Sensor Electronic Technology, Inc. |
发明人 |
Gaska Remigijus;Shatalov Maxim S.;Dobrinsky Alexander;Yang Jinwei;Shur Michael |
分类号 |
H01L33/56;H01L33/48;H01L31/024;H01L33/50;H01L31/0203;H01L31/0232;H01L33/58;H01L33/64 |
主分类号 |
H01L33/56 |
代理机构 |
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代理人 |
|
主权项 |
1. A device package, comprising:
an ultraviolet device for which operation involves ultraviolet radiation of a target wavelength; and an encapsulant located adjacent to at least one surface of the ultraviolet device, wherein the encapsulant is a composite material including:
a matrix material at least partially transparent to ultraviolet radiation of the target wavelength and having a matrix material thermal coefficient of expansion; andat least one filler material at least partially transparent to the ultraviolet radiation incorporated in the matrix material, wherein the at least one filler material includes a combination of microparticles and nanoparticles and has a filler thermal coefficient of expansion at least three times smaller than the matrix material thermal coefficient of expansion for atmospheric conditions present during a curing and a cool down process for fabrication of the device package, and wherein a concentration of the at least one filler material in the composite material exceeds a percolation threshold for the filler material. |
地址 |
Columbia SC US |