发明名称 Ultraviolet Device Encapsulant
摘要 A composite material, which can be used as an encapsulant for an ultraviolet device, is provided. The composite material includes a matrix material and at least one filler material incorporated in the matrix material that are both at least partially transparent to ultraviolet radiation of a target wavelength. The filler material includes microparticles and/or nanoparticles and can have a thermal coefficient of expansion significantly smaller than a thermal coefficient of expansion of the matrix material for relevant atmospheric conditions. The relevant atmospheric conditions can include a temperature and a pressure present during each of: a curing and a cool down process for fabrication of a device package including the composite material and normal operation of the ultraviolet device within the device package.
申请公布号 US2017104140(A1) 申请公布日期 2017.04.13
申请号 US201615389476 申请日期 2016.12.23
申请人 Sensor Electronic Technology, Inc. 发明人 Gaska Remigijus;Shatalov Maxim S.;Dobrinsky Alexander;Yang Jinwei;Shur Michael
分类号 H01L33/56;H01L33/48;H01L31/024;H01L33/50;H01L31/0203;H01L31/0232;H01L33/58;H01L33/64 主分类号 H01L33/56
代理机构 代理人
主权项 1. A device package, comprising: an ultraviolet device for which operation involves ultraviolet radiation of a target wavelength; and an encapsulant located adjacent to at least one surface of the ultraviolet device, wherein the encapsulant is a composite material including: a matrix material at least partially transparent to ultraviolet radiation of the target wavelength and having a matrix material thermal coefficient of expansion; andat least one filler material at least partially transparent to the ultraviolet radiation incorporated in the matrix material, wherein the at least one filler material includes a combination of microparticles and nanoparticles and has a filler thermal coefficient of expansion at least three times smaller than the matrix material thermal coefficient of expansion for atmospheric conditions present during a curing and a cool down process for fabrication of the device package, and wherein a concentration of the at least one filler material in the composite material exceeds a percolation threshold for the filler material.
地址 Columbia SC US