| 发明名称 |
DETECTION OF CRYSTALLOGRAPHIC PROPERTIES IN AEROSPACE COMPONENTS |
| 摘要 |
Aspects of the disclosure are directed to an analysis of a material of a component. A radiation source is activated to transmit radiation to the component. A beam pattern is obtained based on the component interfering with the radiation. The beam pattern is compared to a reference beam pattern. An anomaly is detected to exist in the material when the comparison indicates a deviation between the beam pattern and the reference beam pattern. |
| 申请公布号 |
US2017089845(A1) |
申请公布日期 |
2017.03.30 |
| 申请号 |
US201514867882 |
申请日期 |
2015.09.28 |
| 申请人 |
United Technologies Corporation |
发明人 |
Cernatescu Iuliana;Furrer David U.;Seetharaman Venkatarama K. |
| 分类号 |
G01N23/18 |
主分类号 |
G01N23/18 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method for analyzing a material of a component, comprising:
activating a radiation source to transmit radiation to the component; obtaining a beam pattern based on the component interfering with the radiation; comparing the beam pattern to a reference beam pattern; and detecting that an anomaly exists in the material when the comparison indicates a deviation between the beam pattern and the reference beam pattern. |
| 地址 |
Hartford CT US |
