| 摘要 |
The invention relates to a measurement system using Brillouin back-reflection analysis and including a laser emission device (10) configured to emit an incident wave (v0) and a reference wave (v0-vB). The incident wave has an incident frequency (v0), and the reference wave has a reference frequency (v0-vB). The reference frequency (v0-vB) is shifted from the incident frequency (v0) by a predetermined value (vB). The system is configured to: project the incident wave (v0) into the optical fiber (25), receive a back-reflected wave (v0-vS) in return, generate a composite wave (v0-S; 0-B) combining the back-reflected wave (v0-vS) and the reference wave (v0-vB), and determine at least one property relating to the fiber by analyzing a Brillouin spectrum of the composite wave (v0-S; 0-B). Advantageously, the incident wave and the reference wave come from a dual-frequency, vertical-cavity surface-emitting laser source (12), which is part of the laser emission device. |
