发明名称 |
SEMICONDUCTOR PACKAGE STRUCTURE AND METHOD FOR FORMING THE SAME |
摘要 |
A method for forming a semiconductor package structure is provided. The method for forming a semiconductor package structure includes providing a substrate, wherein the substrate has a front side and a back side, forming a first guard ring doped region and a second guard ring doped region in the substrate, wherein the first guard ring doped region and the second guard ring doped region have different conductive types, forming a trench through the substrate from a back side of the substrate, conformally forming an insulating layer lining the back side of the substrate, a bottom surface and sidewalls of the trench, removing a portion of the insulating layer on the back side of the substrate to form a through via, and forming a conductive material in the through via, wherein a through silicon via (TSV) interconnect structure is formed by the insulating layer and the conductive material. |
申请公布号 |
US2017084488(A1) |
申请公布日期 |
2017.03.23 |
申请号 |
US201615365435 |
申请日期 |
2016.11.30 |
申请人 |
MediaTek Inc. |
发明人 |
HUNG Cheng-Chou;YANG Ming-Tzong;LEE Tung-Hsing;HUANG Wei-Che;HUANG Yu-Hua;LIN Tzu-Hung |
分类号 |
H01L21/768;H01L23/00;H01L29/06;H01L23/48;H01L21/761 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
1. A method for forming a semiconductor package structure, comprising:
providing a substrate, wherein the substrate has a front side and a back side; forming a first guard ring doped region and a second guard ring doped region in the substrate, wherein the first guard ring doped region and the second guard ring doped region have different conductive types; forming a trench through the substrate from a back side of the substrate; conformally forming an insulating layer lining the back side of the substrate, a bottom surface and sidewalls of the trench; removing a portion of the insulating layer on the back side of the substrate to form a through via; and forming a conductive material in the through via, wherein a through silicon via (TSV) interconnect structure is formed by the insulating layer and the conductive material. |
地址 |
Hsin-Chu TW |