发明名称 OPTICAL MEASURING PROBE CALIBRATION
摘要 The invention relates to a calibration device (1) and to a coordinate measuring system for measuring the signal-inducing sensing deflection ITr of tactile measuring probes (2). A reference surface (8) of the reference element (7) is arranged with respect to the field of view (9) of the detector (5) in such a way that, in the event of signal-inducing contact of the sensing surface (4) of the sensing element (3) with the reference surface (8), the sensing surface (4) or parts of the sensing surface (4) lies or lie in the field of view (9) of the detector (5), the detector (5) and the calculation unit (6) being able to calculate the precise position of the sensing element (3) from the detected part of the sensing surface (4).
申请公布号 US2017082416(A1) 申请公布日期 2017.03.23
申请号 US201615270334 申请日期 2016.09.20
申请人 Mikron Agie Charmilles AG 发明人 BESUCHET Jean-Philippe;MONSCH Michael
分类号 G01B5/012 主分类号 G01B5/012
代理机构 代理人
主权项 1. A calibration device (1) for measuring the signal-inducing sensing deflection ITr of tactile measuring probes (2) which have a deflectable sensing element (3) having a sensing surface (4), the calibration device (1) comprising a detector (5), preferably a camera or a laser measuring instrument, having a field of view (9) for detecting the sensing surface (4) of the sensing element (3), a reference element (7) having a reference surface (8), and a calculation unit (6), wherein the reference surface (8) of the reference element (7) is arranged with respect to the field of view (9) of the detector (5) in such a way that, in the event of signal-inducing contact of the sensing surface (4) of the sensing element (3) with the reference surface (8), the sensing surface (4) or parts of the sensing surface (4) lies or lie in the field of view (9) of the detector (5), the detector (5) and the calculation unit (6) being configured to calculate the precise position of the sensing element (3) from the detected part of the sensing surface (4).
地址 Nidau CH