发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 According to one embodiment, the first separation film separates the control electrode, the first insulating layer, the charge storage layer, the intermediate insulating layer, the floating electrode layer, and the second insulating layer in a first direction. The second separation film separates a first stacked unit in a second direction. The first stacked unit includes the charge storage layer, the intermediate insulating layer, the floating electrode layer, the second insulating layer, and the semiconductor layer. The second direction intersects the first direction. The second separation film contains silicon.
申请公布号 US2017077112(A1) 申请公布日期 2017.03.16
申请号 US201615061470 申请日期 2016.03.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MURAKOSHI Atsushi;FURUMOTO Kazuhito
分类号 H01L27/115;H01L21/28;H01L29/423;H01L29/788;H01L29/66 主分类号 H01L27/115
代理机构 代理人
主权项 1. A semiconductor device, comprising: a control electrode extending a first direction; a first insulating layer provided on the control electrode, the first insulating layer containing a metal oxide; a charge storage layer provided on the first insulating layer; an intermediate insulating layer provided on the charge storage layer; a floating electrode layer provided on the intermediate insulating layer; a second insulating layer provided on the floating electrode layer; a semiconductor layer provided on the second insulating layer; a first separation film separating the control electrode, the first insulating layer, the charge storage layer, the intermediate insulating layer, the floating electrode layer, and the second insulating layer in the first direction; and a second separation film separating a first stacked unit in a second direction, the first stacked unit including the charge storage layer, the intermediate insulating layer, the floating electrode layer, the second insulating layer, and the semiconductor layer, the second direction intersecting the first direction, the second separation film containing silicon.
地址 Tokyo JP