发明名称 Semiconductor device and manufacturing method thereof
摘要 A semiconductor device includes a substrate, a first nitride semiconductor layer on the substrate, a second nitride semiconductor layer on the first nitride semiconductor layer, a third nitride semiconductor layer on the second nitride semiconductor layer, an electrode on the third nitride semiconductor layer, and an insulating layer under the electrode and between the first nitride semiconductor layer and the second nitride semiconductor layer.
申请公布号 US9583577(B2) 申请公布日期 2017.02.28
申请号 US201514840732 申请日期 2015.08.31
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Furukawa Chisato;Ogawa Masaaki;Motai Takako;Nishiwaki Wakana
分类号 H01L29/32;H01L29/778;H01L29/66;H01L29/06;H01L29/40;H01L29/417;H01L29/20 主分类号 H01L29/32
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A semiconductor device comprising: a substrate; a first nitride semiconductor layer on the substrate; a second nitride semiconductor layer on the first nitride semiconductor layer; a third nitride semiconductor layer on the second nitride semiconductor layer; a first electrode on the third nitride semiconductor layer; an insulating layer under the electrode and between a portion of the first nitride semiconductor layer and the second nitride semiconductor layer; a second electrode on the third nitride semiconductor layer; and a third electrode, the first electrode comprising a first electrode portion extending in a second direction, the second direction crossing a first direction extending away from the substrate and a second electrode portion extending in a third direction crossing the first direction and the second direction, the first electrode portion electrically connected to the second electrode portion and the second electrode portion electrically connected to the third nitride semiconductor layer, the second electrode comprising a third electrode portion extending in the second direction and a fourth electrode portion extending in the third direction, the third electrode portion electrically connected to the fourth electrode portion, and the fourth electrode portion electrically connected to the third nitride semiconductor layer and aligned to extend in spaced relationship with the second electrode portion, the third electrode comprising a fifth electrode portion extending in the second direction and a sixth electrode portion extending in the third direction, the fifth electrode portion electrically connected to the sixth electrode portion and the sixth electrode portion located between the second electrode portion and the fourth electrode portion, wherein the insulating layer is provided at least under any of the first electrode portion, the third electrode portion, and the fifth electrode portion.
地址 Tokyo JP