发明名称 半導体装置の製造方法
摘要 A semiconductor device production method includes: forming a protection film on a semiconductor substrate; forming a first resist pattern on the protection film; implanting a first impurity ion into the semiconductor substrate using the first resist pattern as a mask; removing the first resist pattern; forming on the surface of the semiconductor substrate a chemical reaction layer that takes in surface atoms from the semiconductor substrate through chemical reaction, after the removing of the first resist pattern; removing the chemical reaction layer formed on the semiconductor substrate and removing the surface of the semiconductor substrate, after the forming of the chemical reaction layer; and growing a semiconductor layer epitaxially on the surface of the semiconductor substrate, after the removing of the surface of the semiconductor substrate.
申请公布号 JP6083150(B2) 申请公布日期 2017.02.22
申请号 JP20120182304 申请日期 2012.08.21
申请人 富士通セミコンダクター株式会社 发明人 王 純志;寺原 政徳
分类号 H01L21/3065;H01L21/265;H01L21/336;H01L21/8238;H01L27/092;H01L29/78 主分类号 H01L21/3065
代理机构 代理人
主权项
地址