发明名称 POLYSILICON THIN FILM TRANSISTOR AND MANUFACTURING METHOD THEREOF, ARRAY SUBSTRATE
摘要 A polysilicon thin film transistor, a manufacturing method thereof, an array substrate involve display technology field, and can repair the boundary defect and the defect state in polysilicon, suppress the hot carrier effect and make the characteristics of TFTs more stable. The polysilicon thin film transistor includes a gate electrode, a source electrode, a drain electrode and an active layer, the active layer comprises at least a channel area, first doped regions, second doped regions and heavily doped regions, and the first doped regions are disposed on two sides of the channel area, the second doped regions are disposed on sides of the first doped regions away from the channel area; the heavily doped regions are disposed on sides of the second doped regions opposed to the first doped regions; and dosage of ions in the heavily doped regions lies between that in the first doped regions and that in the second doped regions.
申请公布号 US2017047352(A1) 申请公布日期 2017.02.16
申请号 US201615340524 申请日期 2016.11.01
申请人 BOE TECHNOLOGY GROUP CO., LTD. ;ORDOS YUANSHENG OPTOELECTRONICS CO., LTD. 发明人 WANG Zuqiang
分类号 H01L27/12 主分类号 H01L27/12
代理机构 代理人
主权项 1. A polysilicon thin film transistor, comprising a gate electrode, a source electrode, a drain electrode and an active layer, wherein the active layer comprises at least a channel area, first doped regions, second doped regions and heavily doped regions, the first doped regions are disposed on two sides of the channel area, the second doped regions are disposed on sides of the first doped regions away from the channel area, and the heavily doped regions are disposed on sides of the second doped regions-opposed to the first doped regions; and a dosage of ions in the heavily doped regions lies between that in the first doped regions and that in the second doped regions.
地址 Beijing CN