发明名称 |
APPARATUS AND METHODS TO DETECT SEMICONDUCTOR DEVICE DEGRADATION DUE TO RADIATION EXPOSURE |
摘要 |
Apparatus and methods to detect degradation due to radiation exposure are described. An example method to detect circuit failure due to radiation exposure includes determining a current of a semiconductor device in an analog circuit, determining an amount of radiation to which the semiconductor device has been exposed based on the current, comparing the amount of radiation to a radiation dose threshold value, and indicating a degradation of the semiconductor device based on the comparison. |
申请公布号 |
US2017038425(A1) |
申请公布日期 |
2017.02.09 |
申请号 |
US201514816298 |
申请日期 |
2015.08.03 |
申请人 |
Fisher Controls International LLC |
发明人 |
WITTKOP Adam Joseph |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method comprising:
determining a current of a semiconductor device in an analog circuit; determining an amount of radiation to which the semiconductor device has been exposed based on the current; comparing the amount of radiation to a radiation dose threshold value; and indicating a degradation of the semiconductor device based on the comparison. |
地址 |
Marshalltown IA US |