发明名称 |
METHODS AND APPARATUS TO IMPROVE DETECTION AND FALSE ALARM RATE OVER IMAGE SEGMENTATION |
摘要 |
Methods, apparatus, systems and articles of manufacture are disclosed herein. An example method to improve object detection and false alarm rate over image segmentation includes overlaying a first object of a first image onto a second image. A first score based on a first chamfer distance between first edges of the first object and second edges in the second image is determined. A second score corresponding to a second chamfer distance between the second edges and a mathematical representation of a plurality of shapes is determined, the second score representing a similarity between the second edges and the plurality of shapes observed simultaneously. A normalized score is determined by normalizing the first score based on the second score. A presence of the second object in the second image matching the first object is detected based on whether the normalized score satisfies a threshold score. |
申请公布号 |
US2017032534(A1) |
申请公布日期 |
2017.02.02 |
申请号 |
US201514810989 |
申请日期 |
2015.07.28 |
申请人 |
The Nielsen Company (US), LLC |
发明人 |
Sullivan Jonathan;Schiller Brian;Terrazas Alejandro;Xie Wei;Bivins Michael Allen |
分类号 |
G06T7/00 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method to detect an object in an image comprising:
retrieving a first image and a second image; determining a first score based on a first chamfer distance between first edges of a first object in the first image and second edges in the second image; determining a second score corresponding to a second chamfer distance between the second edges and a mathematical representation of a plurality of shapes, the second score representing a similarity between the second edges and the plurality of shapes observed simultaneously; determining a normalized score by normalizing the first score based on the second score; and detecting a presence of a second object in the second image matching the first object when the normalized score satisfies a threshold score. |
地址 |
New York NY US |