FAILURE ESTIMATION APPARATUS AND FAILURE ESTIMATION METHOD

摘要

There is a need to improve estimation accuracy of a failure estimation method or its failure estimation apparatus that performs failure estimation on a targeted instrument based on history information about several instruments mounted with the same type of semiconductor device as an instrument targeted at failure estimation. A failure estimation apparatus that includes a history information database storing history information about a plurality of instruments mounted with the same type of semiconductor device and performs failure estimation on a targeted instrument mounted with a semiconductor device whose type equals the type, wherein the history information contains operation information and failure information; wherein the operation information indicates a chronological operating state of the semiconductor device mounted on the instruments; wherein the failure information indicates a failure cause of a failed instrument; and wherein the operating state is categorized into a plurality of classifications.

主权项

1. A failure estimation apparatus that includes a history information database storing history information about a plurality of instruments mounted with the same type of semiconductor device and performs failure estimation on a targeted instrument mounted with a semiconductor device whose type equals the type,
wherein the history information contains operation information and failure information; wherein the operation information indicates a chronological operating state of the semiconductor device mounted on the instruments; wherein the failure information indicates a failure cause of a failed instrument; wherein the operating state is categorized into a plurality of classifications; wherein the failure estimation apparatus stores one of a program and a formula to implement a life estimation algorithm corresponding to each of the classifications and comprises: a history information acquisition portion that acquires most recent history information about the targeted instrument; an operating state analysis portion that specifies classification corresponding to an operating state of a semiconductor device mounted on the targeted instrument based on operation information contained in acquired history information; a life estimation algorithm learning portion that updates a life estimation algorithm corresponding to a specified classification based on acquired history information when determining that the semiconductor device fails based on failure information contained in acquired history information; a life estimation portion that performs life estimation using a life estimation algorithm corresponding to a specified classification when determining that no failure occurs based on failure information contained in acquired history information; and a life estimation result notification portion that notifies a result of the life estimation.