发明名称 低α線ビスマス及び低α線ビスマスの製造方法
摘要 Bismuth characterized by having an α-ray emission of 0.007 cph/cm2 or less; and a process for producing low-α-emission bismuth, characterized by using bismuth having an α-ray emission of 0.15 cph/cm2 or less as a starting material, electrolytically producing a bismuth nitrate solution having a bismuth concentration of 5-50 g/L and a pH of 0.0-0.4, adding a 20-60% aqueous solution of sodium hydroxide to the solution to yield a sediment including polonium, separating the resultant mixture into a sediment (1) and a filtrate (1) by filtration, and then subjecting the filtrate (1) to electrowinning to recover the bismuth. Since recent semiconductor devices have a heightened density and an increased capacity, the risks that software errors occur are increasing due to the influence of α rays from materials present around the semiconductor chips. In particular, the solder materials to be used in the close vicinity to semiconductor devices are strongly desired to have a higher purity, and materials reduced in α rays are also desired. Thus, the present invention addresses the problem of obtaining high-purity bismuth which is reduced in α-ray emission and is usable as the demanded materials.
申请公布号 JP6067855(B2) 申请公布日期 2017.01.25
申请号 JP20150526792 申请日期 2014.09.04
申请人 JX金属株式会社 发明人 細川 侑
分类号 C25C1/22;C22B3/04;C22B3/22;C22B3/44;C22B30/06;C22C12/00 主分类号 C25C1/22
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