发明名称 Conductive paste and method for producing a semiconductor device using the same
摘要 A conductive paste including (A) conductive particles, (B) a glass frit containing substantially no lead, arsenic, tellurium, and antimony, and (C) a solvent. The glass frit (B) has a remelting temperature of 320 to 360° C., wherein the remelting temperature is indicated by a peak top of at least one endothermic peak having an endotherm of 20 J/g or more in a DSC curve as measured by a differential scanning calorimeter. The conductive paste can also include at least one metal oxide (D) selected from the group consisting of tin oxide, zinc oxide, indium oxide, and copper oxide. The glass frit (B) can further include (B-1) Ag2O, (B-2) V2O5, and (B-3) MoO3. The conductive paste can achieve binding at a relatively low temperature (such as 370° C. or lower) and maintains a bond strength at a relatively high temperature (such as 300 to 360° C.).
申请公布号 US9540275(B2) 申请公布日期 2017.01.10
申请号 US201515110575 申请日期 2015.01.15
申请人 NAMICS CORPORATION 发明人 Dietz Raymond;Patelka Maciej;Trumble Cathy Shaw;Sakai Noriyuki;Yamaguchi Hiroshi
分类号 C03C8/24;H01L23/00;C09J9/02;C03C4/14;C03C3/12;H01B1/16 主分类号 C03C8/24
代理机构 Holtz, Holtz & Volek PC 代理人 Holtz, Holtz & Volek PC
主权项 1. A conductive paste comprising: (A) conductive particles, (B) a glass frit containing substantially no lead, arsenic, tellurium, and antimony, and (C) a solvent, the glass frit (B) having a remelting temperature of 320 to 360° C., wherein the remelting temperature is indicated by a peak top of at least one endothermic peak having an endotherm of 20 J/g or more in a DSC curve as measured by a differential scanning calorimeter.
地址 Niigata-shi, Niigata JP