发明名称 X-RAY INSPECTION DEVICE
摘要 In order to provide an x-ray inspection apparatus capable of estimating the mass of material with high accuracy by eliminating the influence of various uncertain factors such as x-ray energy characteristics and specific filter, an x-ray inspection apparatus (10) comprises a sample image obtaining unit (31), an ideal curve generating unit (32), a curve adjustment unit (33), and a mass estimation unit (34) as a function block generated by a control computer (20). The sample image obtaining unit (31) obtains 10 x-ray transmission images of products G each of whose mass is known in advance. The ideal curve generating unit (32) generates a table based on a formula that indicates a relationship between the brightness of an area included in the x-ray transmission images and the estimated mass of the area. The curve adjustment unit (33) refers to the input actual mass of each x-ray transmission image and adjusts the table such that the estimated mass approximates the actual mass. The mass estimation unit (34) determines the estimated mass per unit area based on the post-adjusted table and adds up these masses to determine the total estimated mass of the product (G).
申请公布号 EP1950527(B1) 申请公布日期 2017.01.04
申请号 EP20060823410 申请日期 2006.11.15
申请人 ISHIDA CO., Ltd. 发明人 HIROSE, Osamu
分类号 G01B15/02;G01G9/00;G01N23/04 主分类号 G01B15/02
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