| 摘要 |
The invention relates to a method for characterizing the microstructure of a strip or sheet (8) of metal. The object of providing an improved method for characterizing the microstructure of a strip or sheet of metal is achieved by a method in which a surface area of the strip or sheet (8) is irradiated with x-radiation, wherein the x-radiation at least partially has a continuous spectrum in which the intensity of the x-radiation scattered by the strip or sheet (8) is measured in a spatially resolved manner so as to obtain a spatially resolved intensity pattern, and in which an output variable dependent on the measured intensity pattern is determined and output. The invention also relates to a device (2) for characterizing the microstructure of a strip or sheet (8) of metal, in particular for use in a method according to the invention, comprising at least one x-ray source (4), which is designed to irradiate a surface area of a strip or sheet (8), wherein the x-radiation has an at least partially continuous spectrum. The invention also relates to a metal processing installation, in particular a rolling train for rolling a strip or sheet (8) of metal. |
