发明名称 ANALYTE METER WITH CONTOURED STRIP PORT TO IMPROVE ELECTROCHEMICAL TEST STRIP RELIABILITY
摘要 An analyte meter, such as a blood glucose meter, uses electrochemical test strips and has a contoured strip port to improve electrochemical test strip reliability. The analyte meter has a strip connector with strip terminals that electrically connected to strip electrodes when a test strip is inserted through the strip port opening next to the strip connector. The contoured strip port is located next to the strip connector and comprises a strip shelf having side guides for aligning the test strip with the strip port, a strip port opening having a bottom opening extending from a first bottom edge to a second bottom edge, top guides located at a first top edge and a second top edge, and a contoured top extending between the top guides creating an arched clearance above the bottom opening to provide clearance for test strip electrical traces.
申请公布号 US2016290951(A1) 申请公布日期 2016.10.06
申请号 US201514674972 申请日期 2015.03.31
申请人 Roche Diabetes Care, Inc. 发明人 Coburn Caleb J.;Riggles Randall K.;Sauers Matthew C.;Uberta, III Anthony J.
分类号 G01N27/327 主分类号 G01N27/327
代理机构 代理人
主权项 1. An analyte meter with contoured strip port to improve electrochemical test strip reliability, comprising: an analyte meter that comprises, a housing carrying a circuit board,a meter processor coupled to the circuit board,memory coupled to the circuit board and connected to the meter processor,a display connected to the meter processor,a measurement processor connected to meter processor, anda strip connector connected to the measurement processor, the strip connector having connector terminals; a contoured strip port carried in the housing and located next to the strip connector, the contoured strip port comprises, a strip shelf having side guides for aligning a test strip with the contoured strip port,a strip port opening that comprises, an opening bottom extending from a first bottom edge to a second bottom edge,top guides located at a first top edge and a second top edge, anda contoured top extending between the top guides creating an arched clearance above the opening bottom to provide clearance for test strip electrical traces.
地址 Indianapolis IN US