发明名称 半導体装置の製造方法
摘要 A method for manufacturing a semiconductor device includes: forming a metal layer on a semiconductor layer; forming a plated layer having a pattern corresponding to a pattern of a gate bus line which couples each gate finger of a plurality of FETs on the metal layer, the pattern corresponding to the pattern of the gate bus line having a deficient part; forming a mask layer which covers the metal layer exposed in the deficient part; and patterning the metal layer by using the plated layer and the mask layer as a mask.
申请公布号 JP5979530(B2) 申请公布日期 2016.08.24
申请号 JP20110235436 申请日期 2011.10.26
申请人 住友電工デバイス・イノベーション株式会社 发明人 梶井 清
分类号 H01L21/338;H01L21/3205;H01L21/768;H01L21/822;H01L23/532;H01L27/04;H01L29/778;H01L29/812 主分类号 H01L21/338
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