发明名称 X-RAY BEAM INTENSITY MONITORING DEVICE AND X-RAY INSPECTION SYSTEM
摘要 The present invention discloses an X-ray beam intensity monitoring device and an X-ray inspection system. The X-ray beam intensity monitoring device comprises an intensity detecting module (5) and a data processing module, wherein the intensity detecting module is adopted to be irradiated by the X-ray beam and send a detecting signal, the data processing module is coupled with the intensity detecting module to receive the detecting signal and output an X-ray beam intensity monitoring signal, wherein the X-ray beam intensity monitoring signal includes a dose monitoring signal of the X-ray beam and a brightness correction signal of the X-ray beam. The X-ray beam intensity monitoring device can simultaneously perform dose monitoring and brightness monitoring, thereby improving the service efficiency of the X-ray beam intensity monitoring device. Moreover, the monitoring result of the X-ray beam intensity can be more accurate and reliable.
申请公布号 EP3040744(A1) 申请公布日期 2016.07.06
申请号 EP20150203078 申请日期 2015.12.30
申请人 NUCTECH COMPANY LIMITED;TSINGHUA UNIVERSITY 发明人 LI, YUANJING;KANG, KEJUN;LI, SHUWEI;ZHANG, QINGJUN;LI, YULAN;ZHAO, ZIRAN;LIU, YINONG;LIU, YAOHONG;ZHU, WEIBIN;ZHAO, XIAOLIN;HE, HUISHAO
分类号 G01V5/00;G01T1/17 主分类号 G01V5/00
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