发明名称 3D Packages and Methods for Forming the Same
摘要 Embodiments of the present disclosure include a semiconductor device and methods of forming a semiconductor device. An embodiment is a semiconductor device comprising an interconnecting structure consisting of a plurality of thin film layers and a plurality of metal layers disposed therein, each of the plurality of metal layers having substantially a same top surface area, and a die comprising an active surface and a backside surface opposite the active surface, the active surface being directly coupled to a first side of the interconnecting structure. The semiconductor device further comprises a first connector directly coupled to a second side of the interconnecting structure, the second side being opposite the first side.
申请公布号 US2016181124(A1) 申请公布日期 2016.06.23
申请号 US201615054770 申请日期 2016.02.26
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chiu Tzu-Wei;Hsieh Cheng-Hsien;Hu Hsien-Pin;Hsu Kuo-Ching;Hou Shang-Yun;Jeng Shin-Puu
分类号 H01L21/48 主分类号 H01L21/48
代理机构 代理人
主权项 1. A method of forming a semiconductor device, the method comprising: forming a first passivation layer over a first substrate; forming an interconnecting structure over the first passivation layer, the interconnecting structure comprising a plurality of metal layers disposed in a plurality of thin film dielectric layers; bonding a die to a first side of the interconnecting structure; etching the first substrate from a second side of the interconnecting structure to expose the first passivation layer; and forming a first connector on and extending through the first passivation layer, the first connector coupled to at least one of the plurality of metal layers.
地址 Hsin-Chu TW
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