发明名称 |
3D Packages and Methods for Forming the Same |
摘要 |
Embodiments of the present disclosure include a semiconductor device and methods of forming a semiconductor device. An embodiment is a semiconductor device comprising an interconnecting structure consisting of a plurality of thin film layers and a plurality of metal layers disposed therein, each of the plurality of metal layers having substantially a same top surface area, and a die comprising an active surface and a backside surface opposite the active surface, the active surface being directly coupled to a first side of the interconnecting structure. The semiconductor device further comprises a first connector directly coupled to a second side of the interconnecting structure, the second side being opposite the first side. |
申请公布号 |
US2016181124(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201615054770 |
申请日期 |
2016.02.26 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chiu Tzu-Wei;Hsieh Cheng-Hsien;Hu Hsien-Pin;Hsu Kuo-Ching;Hou Shang-Yun;Jeng Shin-Puu |
分类号 |
H01L21/48 |
主分类号 |
H01L21/48 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of forming a semiconductor device, the method comprising:
forming a first passivation layer over a first substrate; forming an interconnecting structure over the first passivation layer, the interconnecting structure comprising a plurality of metal layers disposed in a plurality of thin film dielectric layers; bonding a die to a first side of the interconnecting structure; etching the first substrate from a second side of the interconnecting structure to expose the first passivation layer; and forming a first connector on and extending through the first passivation layer, the first connector coupled to at least one of the plurality of metal layers. |
地址 |
Hsin-Chu TW |