发明名称 |
TOPOLOGICAL METHOD TO BUILD SELF-ALIGNED MTJ WITHOUT A MASK |
摘要 |
A method of forming a self-aligned MTJ without using a photolithography mask and the resulting device are provided. Embodiments include forming a first electrode over a metal layer, the metal layer recessed in a low-k dielectric layer; forming a MTJ layer over the first electrode; forming a second electrode over the MTJ layer; removing portions of the second electrode, the MTJ layer, and the first electrode down to the low-k dielectric layer; forming a silicon nitride-based layer over the second electrode and the low-k dielectric layer; and planarizing the silicon nitride-based layer down to the second electrode. |
申请公布号 |
US2016141489(A1) |
申请公布日期 |
2016.05.19 |
申请号 |
US201514841997 |
申请日期 |
2015.09.01 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
ZHANG Xunyuan;XIE Ruilong;CAI Xiuyu;NAM Seowoo;CHO Hyun-Jin |
分类号 |
H01L43/08;H01L43/12;H01L43/02 |
主分类号 |
H01L43/08 |
代理机构 |
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代理人 |
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主权项 |
1. A device comprising:
a low-k dielectric layer; a metal layer recessed in the low-k dielectric layer; a first electrode formed on the metal layer; a self-aligned magnetic tunnel junction (MTJ) formed on the first electrode; a second electrode formed on the MTJ; and a silicon nitride-based layer formed on the low-k dielectric substrate and adjacent to an outer edge of the first electrode, the MTJ, and the second electrode. |
地址 |
Grand Cayman KY |