发明名称 Lithography Patterning Technique
摘要 A method for lithography patterning includes providing a substrate; forming a material layer over the substrate; exposing the material layer to a radiation, resulting in an exposed material layer; and removing a portion of the exposed material layer in a developer, resulting in a patterned material layer. The developer is an alkaline aqueous solution having an organic base that is a quaternary ammonium hydroxide. In an embodiment, the organic base has a bulky group in its side chain, reducing its etching distance. In another embodiment, the organic base includes electron withdrawing groups, reducing its basicity. In yet another embodiment, the developer has a loading of the quaternary ammine ranging from about 0.01% to about 2.37%. The developer results in reduced line edge roughness and reduced line width roughness in the patterned material layer.
申请公布号 US2016124310(A1) 申请公布日期 2016.05.05
申请号 US201414529944 申请日期 2014.10.31
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lilin Chang;Chang Ching-Yu
分类号 G03F7/32;G03F7/20 主分类号 G03F7/32
代理机构 代理人
主权项 1. A method for lithography patterning, comprising: providing a substrate; forming a material layer over the substrate; exposing the material layer to a radiation, resulting in an exposed material layer; and removing a portion of the exposed material layer in a developer, resulting in a patterned material layer, wherein the developer is an alkaline aqueous solution having an organic base that is a quaternary ammonium hydroxide.
地址 Hsin-Chu TW