发明名称 MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME
摘要 Disclosed is a memory device which is capable of being repaired permanently and impermanently. The memory device may comprise: an address latch circuit which latches an address received from the outside of the memory device; a repair signal generation circuit which generates a soft repair signal; a selection information generation circuit which generates first selection information using first bits of the address latched in the address latch circuit; first to N^th register circuits, wherein second bits of the address latched in the address latch circuit are stored as repair data in a circuit selected among the first to N^th register circuits by the first selection information when the soft repair signal is enabled; and first to N^th memory blocks each of which is repaired using repair data stored in each of the first to N^th register circuits.
申请公布号 KR20160046502(A) 申请公布日期 2016.04.29
申请号 KR20140142474 申请日期 2014.10.21
申请人 SK HYNIX INC. 发明人 YANG, JONG YEOL;YOU, JUNG TAEK;PARK, GA RAM
分类号 G11C29/04 主分类号 G11C29/04
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