发明名称 |
MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME |
摘要 |
Disclosed is a memory device which is capable of being repaired permanently and impermanently. The memory device may comprise: an address latch circuit which latches an address received from the outside of the memory device; a repair signal generation circuit which generates a soft repair signal; a selection information generation circuit which generates first selection information using first bits of the address latched in the address latch circuit; first to N^th register circuits, wherein second bits of the address latched in the address latch circuit are stored as repair data in a circuit selected among the first to N^th register circuits by the first selection information when the soft repair signal is enabled; and first to N^th memory blocks each of which is repaired using repair data stored in each of the first to N^th register circuits. |
申请公布号 |
KR20160046502(A) |
申请公布日期 |
2016.04.29 |
申请号 |
KR20140142474 |
申请日期 |
2014.10.21 |
申请人 |
SK HYNIX INC. |
发明人 |
YANG, JONG YEOL;YOU, JUNG TAEK;PARK, GA RAM |
分类号 |
G11C29/04 |
主分类号 |
G11C29/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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