发明名称 |
DISPLACEMENT MEASUREMENT DEVICE AND DISPLACEMENT MEASUREMENT METHOD |
摘要 |
A displacement measurement device includes: a light source; a first diffraction grating and a second diffraction grating arranged along a path of light from the light source and movable relative to one another, the first and second diffraction gratings generating diffracted light; an optical sensor that detects interference light produced by interference between −nth order diffracted light generated as a result of the second diffraction grating diffracting +nth order diffracted light from the first diffraction grating and +nth order diffracted light generated as a result of the second diffraction grating diffracting −nth order diffracted light from the first diffraction grating, where n is a natural number greater than or equal to 1; and a calculation unit calculating, according to a signal from the optical sensor, a relative displacement between the first and second diffraction gratings in a direction orthogonal to an optical axis of the first and second diffraction gratings. |
申请公布号 |
US2016116305(A1) |
申请公布日期 |
2016.04.28 |
申请号 |
US201614989675 |
申请日期 |
2016.01.06 |
申请人 |
TAIYO YUDEN CO., LTD. |
发明人 |
MIYAZAWA Fuyuki;HAGIWARA Yasuhito;HAMAMOTO Takaki;OYAMA Katsuhiro |
分类号 |
G01D5/26;G01M11/08 |
主分类号 |
G01D5/26 |
代理机构 |
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代理人 |
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主权项 |
1. A displacement measurement device, comprising:
a light source; a first diffraction grating and a second diffraction grating that are arranged along a progression path of light from the light source and that are movable relative to one another, the first diffraction grating and the second diffraction grating generating diffracted light; an optical sensor that detects interference light produced by interference between −nth order diffracted light generated as a result of the second diffraction grating diffracting +nth order diffracted light from the first diffraction grating and +nth order diffracted light generated as a result of the second diffraction grating diffracting −nth order diffracted light from the first diffraction grating, where n is a natural number greater than or equal to 1; and a calculation unit that calculates, in accordance with a signal from the optical sensor, a relative displacement between the first diffraction grating and the second diffraction grating in a direction orthogonal to an optical axis of the first diffraction grating and the second diffraction grating. |
地址 |
Tokyo JP |