发明名称 WET CLEAN PROCESS FOR CLEANING PLASMA PROCESSING CHAMBER COMPONENTS
摘要 PROBLEM TO BE SOLVED: To provide a system and method of cleaning a component of a plasma processing chamber.SOLUTION: The method includes removing the component from the plasma processing chamber, the removed component including a material deposited on the surface of the component. A heated oxidizing solution is applied to the material deposited on the component to oxidize a first portion of the deposited material. A stripping solution is applied to the component to remove the oxidized first portion of the deposited material. An etching solution is applied to remove a second portion of the deposited material, and the cleaned component can be rinsed and dried.SELECTED DRAWING: Figure 3A
申请公布号 JP2016063226(A) 申请公布日期 2016.04.25
申请号 JP20150178095 申请日期 2015.09.10
申请人 LAM RESEARCH CORPORATION 发明人 ARMEN AVOYAN;KENNET BAYLON
分类号 H01L21/3065;C23F1/16;C23G1/00;H01L21/304;H01L21/31 主分类号 H01L21/3065
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