发明名称 |
WET CLEAN PROCESS FOR CLEANING PLASMA PROCESSING CHAMBER COMPONENTS |
摘要 |
PROBLEM TO BE SOLVED: To provide a system and method of cleaning a component of a plasma processing chamber.SOLUTION: The method includes removing the component from the plasma processing chamber, the removed component including a material deposited on the surface of the component. A heated oxidizing solution is applied to the material deposited on the component to oxidize a first portion of the deposited material. A stripping solution is applied to the component to remove the oxidized first portion of the deposited material. An etching solution is applied to remove a second portion of the deposited material, and the cleaned component can be rinsed and dried.SELECTED DRAWING: Figure 3A |
申请公布号 |
JP2016063226(A) |
申请公布日期 |
2016.04.25 |
申请号 |
JP20150178095 |
申请日期 |
2015.09.10 |
申请人 |
LAM RESEARCH CORPORATION |
发明人 |
ARMEN AVOYAN;KENNET BAYLON |
分类号 |
H01L21/3065;C23F1/16;C23G1/00;H01L21/304;H01L21/31 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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