发明名称 走査型プローブ顕微鏡の探針形状評価方法
摘要 Provided is a method of evaluating a probe tip shape in a scanning probe microscope, including: measuring the probe tip shape by a probe shape test sample having a needle-like structure; determining radii of cross-sections at a plurality of distances from the apex; and calculating, based on the distances and the radii, a radius of curvature when the probe tip shape is approximated by a circle.
申请公布号 JP5902485(B2) 申请公布日期 2016.04.13
申请号 JP20120002366 申请日期 2012.01.10
申请人 株式会社日立ハイテクサイエンス 发明人 渡邉 将史;百田 洋海
分类号 G01Q40/02 主分类号 G01Q40/02
代理机构 代理人
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