发明名称 METHOD FOR CHEMICAL-MECHANICAL POLISHING OF A SUBSTRATE
摘要 This invention provides a polishing medium for chemical-mechanical polishing, comprising an oxidizing agent for a conductor, a protective-film-forming agent for protecting a metal surface, an acid, and water; (1) the polishing medium having a pH of 3 or less, and the oxidizing agent being in a concentration of from 0.01 to 3% by weight, or (2) the polishing medium containing abrasive grains having an average particle diameter of 50 nm or less, and the abrasive grains having standard deviation of particle size distribution in a value of more than 5 nm. <IMAGE>
申请公布号 EP1211717(B1) 申请公布日期 2016.04.13
申请号 EP20000953466 申请日期 2000.08.17
申请人 HITACHI CHEMICAL COMPANY, LTD. 发明人 KURATA, YASUSHI;KAMIGATA, YASUO;UCHIDA, TAKESHI;TERASAKI, HIROKI;IGARASHI, AKIKO
分类号 H01L21/304;H01L21/321;B24B37/00;C09G1/02;C09K3/14;C23F3/06;H01L21/768 主分类号 H01L21/304
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