发明名称 半導体装置の製造方法
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device capable of forming a metal electrode at low cost while using cutting or grinding work. <P>SOLUTION: A manufacturing method of a semiconductor device comprises the steps of: forming a base electrode 14 on a principal surface 12a of a semiconductor substrate 12; forming a protection film 16 covering the base electrode and forming an opening 16a for exposing the base electrode to the protection film; forming a first metal film 22 so as to cover a surface of the base electrode visible from the protection film and the opening; patterning the first metal film by removing the portion of the protection film positioned on a reference surface P1 provided in parallel to a suction stage 30 and the portion of the first metal film by cutting in a state in which the semiconductor substrate in which the first metal film is formed is sucked and fixed at the suction stage using a rear surface 12b as a mounting surface; and thinning the thickness of the semiconductor substrate to a prescribed thickness by grinding the rear surface of the semiconductor substrate after the patterning step. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP5899740(B2) 申请公布日期 2016.04.06
申请号 JP20110203963 申请日期 2011.09.19
申请人 株式会社デンソー 发明人 富坂 学;赤松 和夫;加世田 要;稲垣 秀哉
分类号 H01L21/60;H01L21/3205;H01L21/768;H01L23/522 主分类号 H01L21/60
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