发明名称 METHOD FOR GROWING NITRIDE-BASED SEMICONDUCTOR WITH HIGH QUALITY
摘要 Disclosed is a method for growing a nitride-based semiconductor with high quality, the method including: forming a first mask layer on a substrate and forming a second mask layer on the first mask layer; performing dry etching on the first mask layer and the second mask layer to form an opening in which a part of the substrate is exposed; performing selective wet etching on the first mask layer in the opening to form a recess in which a part of the substrate is exposed; depositing a third mask layer in the recess; and growing a nitride-based semiconductor from the exposed part of the substrate on sides of the third mask layer and expanding the growth via the opening.
申请公布号 US2016093492(A1) 申请公布日期 2016.03.31
申请号 US201514859898 申请日期 2015.09.21
申请人 GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 LEE Dong-Seon;SEO Dong-Ju;LEE Jun-Youb;KANG Chang-Mo;SEONG Won-Seok;PARK Mun-Do
分类号 H01L21/02;H01L21/311;H01L21/033 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method for growing a nitride-based semiconductor with high quality, the method comprising: forming a first mask layer on a substrate and forming a second mask layer on the first mask layer; performing dry etching on the first mask layer and the second mask layer to form an opening in which a part of the substrate is exposed; performing selective wet etching on the first mask layer in the opening to form a recess in which a part of the substrate is exposed; depositing a third mask layer in the recess; and growing a nitride-based semiconductor from the exposed part of the substrate on sides of the third mask layer and expanding the growth via the opening.
地址 Gwangju KR