发明名称 Method for determining characteristics of a photoconverter without contact
摘要 The invention relates to a method for determining the maximum open circuit voltage and the power that can be output by a photoconverter material subject to a measurement light intensity, the method including the following steps: measuring the photoluminescent intensity of the material, measuring the absorption rate of the photoconverter material at a second wavelength substantially equal to the photoluminescent wavelength of the photoconverter material, determining the maximum open circuit voltage of the photoconverter material with the measurement light intensity by means of the absorption rate and the photoluminescent intensity measured at substantially the same wavelength; said invention being characterized in that the light source and the photoconverter material are arranged such that the angular distributions of the rays incident on and emitted by the lit surface of the material and collected by the detector are substantially identical.
申请公布号 US9297764(B2) 申请公布日期 2016.03.29
申请号 US201113574975 申请日期 2011.02.07
申请人 CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE—CNRS—;ELECTRICITE DE FRANCE;UNIVERSITE DE VERSAILLES SAINT-QUENTIN-EN-YVELINES 发明人 Guillemoles Jean-François;Etcheberry Arnaud;Gerard Isabelle;Tran-Van Pierre
分类号 G01R31/00;G06F19/00;G01N21/64;G01N21/47;H02S50/10 主分类号 G01R31/00
代理机构 Miller, Matthias & Hull LLP 代理人 Miller, Matthias & Hull LLP
主权项 1. A method for determining the maximum open circuit voltage of a photoconverter material exposed to a measurement light intensity, said method comprising the following steps: the photoluminescence intensity of the photoconverter material is measured by illuminating the photoconverter material using a first light source at a first light intensity and at a first wavelength corresponding to a first excitation energy greater than the absorption energy of the photoconverter material, the first light intensity being substantially equal to the measurement light intensity; the absorptivity of the photoconverter material is measured at a second wavelength substantially equal to one of the photoluminescence wavelengths of the photoconverter material, by illuminating the photoconverter material using a second light source at the second wavelength and at a second light intensity; and the maximum open circuit voltage of the photoconverter material at the measurement light intensity is determined using the absorptivity and the photoluminescence intensity, both measured at substantially the same wavelength, wherein the light source and the photoconverter material are arranged such that the angular distributions of the rays incident on and emitted by the illuminated surface of the material and collected by the detector are substantially the same.
地址 Paris FR