| 摘要 |
The present invention provides a socket for testing electronic components. Disclosed socket for testing electronic components comprises: a main body block having a resting part for resting a connection terminal of the electronic component ; a transfer block connected to the main body block to allow hinge rotation; a floating block, which snaps and connects to the transfer block, has a conductive pin part inside, that is located collinearly to the connection terminal in vertical direction, during hinge rotation, to apply an electric signal via connection with the connection terminal; and a stopper unit which binds and fixes the floating block to the main body block, while the connection terminal of the electronic components connects to the conductive pin part, to prevent product damage beforehand in a contact process, as well as increase product test′s yield, by ensuring an exact vertical contact operation between the connection terminal and the conductive pin part, while testing electronic components. |
