发明名称 Surface finish on trace for a thermal compression flip chip (TCFC)
摘要 Some implementations provide a semiconductor device that includes a substrate coupled to a die through a thermal compression bonding process. The semiconductor device also includes a trace coupled to the substrate. The trace includes a first conductive material having a first oxidation property. The trace also includes a first surface layer including a second conductive material having a second oxidation property. The second oxidation property is less susceptible to oxidation than the first oxidation property. The first and second conductive materials are configured to provide an electrical path between the die and the substrate. The first surface layer has a thickness that is 0.3 microns (μm) or less.
申请公布号 US9269681(B2) 申请公布日期 2016.02.23
申请号 US201313741810 申请日期 2013.01.15
申请人 QUALCOMM Incorporated 发明人 Jomaa Houssam W.;Bchir Omar J.;Shah Milind P.;Aldrete Manuel;Kim Chin-Kwan
分类号 H01L21/56;H01L23/00 主分类号 H01L21/56
代理机构 代理人 Gunderson Linda G.
主权项 1. A semiconductor device comprising: a substrate coupled to a die; and a plurality of traces coupled to the substrate, each respective trace comprising a first conductive material having a first oxidation property and having a top surface and side surfaces along the trace and a first surface layer on the top surface and side surfaces of the trace, the first surface layer comprising a nickel having a second oxidation property, the second oxidation property being less susceptible to oxidation than the first oxidation property, the first and second conductive materials configured to provide an electrical path between the die and the substrate, the first nickel surface layer having a thickness that is 0.3 microns (μm) or less.
地址 San Diego CA US
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