发明名称 One-time programmable integrated circuit security
摘要 One-time programmable integrated circuit security is described. An example of a method of protecting memory assets in an integrated circuit includes sampling values of multiple OTP memory arrays and comparing the sampled value of each OTP memory array with the sampled value of each other OTP memory array and with an unprogrammed OTP memory array value. The method further includes determining if an integrated circuit performance fault has occurred based on the compared sampled values, booting the integrated circuit, and operating the integrated circuit with access to memory determined by the fault occurrence determination.
申请公布号 US9262259(B2) 申请公布日期 2016.02.16
申请号 US201313741248 申请日期 2013.01.14
申请人 QUALCOMM Incorporated 发明人 Ashkenazi Asaf
分类号 G06F21/78;G06F11/08;G06F21/71;H04L9/00 主分类号 G06F21/78
代理机构 代理人 Gallardo Michelle S.
主权项 1. A method of protecting memory assets in an integrated circuit, the method comprising: sampling a value of each of a plurality of one-time programmable (OTP) memory arrays; comparing the sampled value of each OTP memory array of the plurality of OTP memory arrays with the sampled value of each other OTP memory array of the plurality of OTP memory arrays and with an unprogrammed OTP memory array value wherein the unprogrammed OTP memory array value corresponds to n bits all of a same logic value associated with an as-manufactured OTP memory array, n being a number of memory devices in each of the plurality of OTP memory arrays; determining if the sampled value of each OTP memory array is equal to the sampled value of each other OTP memory array; determining that an integrated circuit performance fault has occurred if the sampled value of each OTP memory array is equal to the sampled value of each other OTP memory array and the sampled value of each OTP memory array is equal to the unprogrammed OTP memory array value; and operating the integrated circuit with access to memory determined by the fault occurrence determination.
地址 San Diego CA US
您可能感兴趣的专利