发明名称 PATTERN FORMING METHOD
摘要 A pattern forming method of forming a pattern on an underlying layer of a target object includes forming a block copolymer layer, which includes a first polymer and a second polymer and is configured to be self-assembled, on the underlying layer; processing the target object to form a first region containing the first polymer and a second region containing the second polymer in the block copolymer layer; etching the second region partway in a thickness direction thereof in a capacitively coupled plasma processing apparatus after the processing of the target object; generating secondary electrons from an upper electrode of the plasma processing apparatus by applying a negative DC voltage to the upper electrode and irradiating the secondary electrons onto the target object, after the etching of the second region; and additionally etching the second region in the plasma processing apparatus after the irradiating of the secondary electrons.
申请公布号 US2016042970(A1) 申请公布日期 2016.02.11
申请号 US201414776886 申请日期 2014.04.09
申请人 TOKYO ELECTRON LIMITED 发明人 Morikita Shinya;Nishimura Eiichi;Yamashita Fumiko
分类号 H01L21/311;H01L21/02 主分类号 H01L21/311
代理机构 代理人
主权项 1. A pattern forming method of forming a pattern on an underlying layer of a target object, comprising: forming a block copolymer layer, which includes a first polymer and a second polymer and is configured to be self-assembled, on the underlying layer; processing the target object to form a first region containing the first polymer and a second region containing the second polymer in the block copolymer layer; etching the second region partway in a thickness direction of the second region in a capacitively coupled plasma processing apparatus after the processing of the target object; generating secondary electrons from an upper electrode of the plasma processing apparatus by applying a negative DC voltage to the upper electrode and irradiating the secondary electrons onto the target object, after the etching of the second region; and additionally etching the second region in the plasma processing apparatus after the irradiating of the secondary electrons onto the target object.
地址 Tokyo JP