发明名称 SCHOTTKY BARRIER DIODE FORMED ON NITRIDE SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To solve a problem that when an anode electrode 22 which forms Schottky contact and a cathode electrode 20 which forms ohmic contact are formed on a surface of a substrate on which a first nitride semiconductor layer 6 serving as an electron transit layer of a HEMT and a second nitride semiconductor layer 8 serving as an electron supply layer of the HEMT are laminated, a SBD (Schottky Barrier Diode) can be obtained but a leakage current is large and breakdown voltage is low.SOLUTION: In a Schottky Barrier Diode formed on a nitride semiconductor substrate, a region where a second nitride semiconductor layer 8 directly contacts the anode electrode 22 and a region where the second nitride semiconductor layer 8 contacts the anode electrode 22 via a fourth nitride semiconductor region 12b and a third nitride semiconductor region 10b exist in a mixed manner. By changing the fourth nitride semiconductor region 12b to a p-type, a leakage current can be inhibited. By using a nitride semiconductor having a bandgap larger than that of the second nitride semiconductor layer 8 for the third nitride semiconductor region 10b, the minimum value of a forward voltage where a forward current flows can be kept as low as possible.SELECTED DRAWING: Figure 1
申请公布号 JP2016018939(A) 申请公布日期 2016.02.01
申请号 JP20140141916 申请日期 2014.07.10
申请人 TOYOTA CENTRAL R&D LABS INC;TOYOTA MOTOR CORP 发明人 KANECHIKA MASAKAZU;UEDA HIROYUKI;NISHIKAWA KOICHI;TOMITA HIDEMIKI
分类号 H01L29/872;H01L21/337;H01L21/338;H01L21/8232;H01L27/06;H01L27/095;H01L27/098;H01L29/47;H01L29/778;H01L29/808;H01L29/812 主分类号 H01L29/872
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