发明名称 |
Methods and apparatus for detecting azimuthal non-uniformity in a plasma processing system |
摘要 |
Apparatus and methods for assessing RF return current azimuthal uniformity are disclosed. A plurality of non-linear substantially-enclosed RF current sensors are disposed azimuthally around a central axis of a plasma processing chamber. When a plasma is ignited in the plasma processing chamber, the RF return currents are sensed in the plurality of non-linear substantially-enclosed RF current sensors and analyzed to ascertain whether RF return current azimuthal uniformity is acceptable. |
申请公布号 |
US9245720(B2) |
申请公布日期 |
2016.01.26 |
申请号 |
US201213494456 |
申请日期 |
2012.06.12 |
申请人 |
Lam Research Corporation |
发明人 |
Marakhtanov Alexei;Dhindsa Rajinder |
分类号 |
H01L21/00;H01J37/32;G01R19/00;G01R29/08 |
主分类号 |
H01L21/00 |
代理机构 |
Martine Penilla Group, LLP |
代理人 |
Martine Penilla Group, LLP |
主权项 |
1. A plasma processing system having a plasma processing chamber, including a lower electrode assembly, comprising:
a plurality of RF straps to permit RF currents to traverse said plurality of RF straps; a plurality of sensors, each of said plurality of sensors being coupled with one of said plurality of straps, and each of said plurality of sensors has a first end and a second end separated by a gap to provide coupling with said one of said plurality of straps, wherein each sensor represents a non-linear substantially enclosed RF sensor; wherein said non-linear substantially enclosed RF sensor is coupled to a co-axial cable, a sheath of said co-axial cable is coupled to a first portion of said non-linear substantially enclosed RF sensor and a core of said co-axial cable is coupled to a second portion of said non-linear substantially enclosed RF sensor to acquire voltage measurements between said first portion and said second portion. |
地址 |
Fremont CA US |