发明名称 Methods and apparatus for detecting azimuthal non-uniformity in a plasma processing system
摘要 Apparatus and methods for assessing RF return current azimuthal uniformity are disclosed. A plurality of non-linear substantially-enclosed RF current sensors are disposed azimuthally around a central axis of a plasma processing chamber. When a plasma is ignited in the plasma processing chamber, the RF return currents are sensed in the plurality of non-linear substantially-enclosed RF current sensors and analyzed to ascertain whether RF return current azimuthal uniformity is acceptable.
申请公布号 US9245720(B2) 申请公布日期 2016.01.26
申请号 US201213494456 申请日期 2012.06.12
申请人 Lam Research Corporation 发明人 Marakhtanov Alexei;Dhindsa Rajinder
分类号 H01L21/00;H01J37/32;G01R19/00;G01R29/08 主分类号 H01L21/00
代理机构 Martine Penilla Group, LLP 代理人 Martine Penilla Group, LLP
主权项 1. A plasma processing system having a plasma processing chamber, including a lower electrode assembly, comprising: a plurality of RF straps to permit RF currents to traverse said plurality of RF straps; a plurality of sensors, each of said plurality of sensors being coupled with one of said plurality of straps, and each of said plurality of sensors has a first end and a second end separated by a gap to provide coupling with said one of said plurality of straps, wherein each sensor represents a non-linear substantially enclosed RF sensor; wherein said non-linear substantially enclosed RF sensor is coupled to a co-axial cable, a sheath of said co-axial cable is coupled to a first portion of said non-linear substantially enclosed RF sensor and a core of said co-axial cable is coupled to a second portion of said non-linear substantially enclosed RF sensor to acquire voltage measurements between said first portion and said second portion.
地址 Fremont CA US